Plant phenomics symposium registration due by Oct. 1
The “Plant Phenomics: From Pixels to Traits” symposium will be held at the Nebraska Innovation Campus Conference Center Oct. 15-16.
Register online at http://www.unl.edu/psi/2015-plant-science-symposium by Oct. 1. The symposium is free to all attendees.
Various "omics" technologies have been used to characterize the molecular and biochemical status of plants, which to date has far outpaced the ability to comprehensively phenotype plants. Moreover, only a small fraction of generated data from –omics platforms has been linked and integrated with observable changes in plant growth and development, leaving a gap in the understanding of how genomic and metabolomic status affects plant phenotypes. The “Plant Phenomics: pixels to traits” symposium brings together a diverse set of scientists who are pioneers in addressing this grand challenge of bridging the genotype to phenotype gap in plant biology.
Robert Furbank, from the Commonwealth Scientific and Industrial Research Organization in Australia
Anatoly Gitelson, from UNL
Steve Long, from the University of Illinois at Urbana–Champaign
Edgar Spalding, from the University of Wisconsin
Christopher Topp, from the Donald Danforth Plant Science Center in St. Louis
Harkamal Walia, from UNL